CIQTEK Lists on the Shanghai STAR Market CIQTEK held its listing ceremony at the Shanghai Stock Exchange on August 11, 2026. The listing marks a new stage for the company as it continues to develop high-end scientific instruments. The company trades under stock code 688828 and develops, manufactures, and sells products including electron microscopes, electron paramagnetic resonance spectrometers, and nuclear magnetic resonance spectrometers. Listing Information CIQTEK issued 40.0100 million shares at RMB 21.22 per share. The gross proceeds from the new share offering were RMB 849.0122 million. Following the offering, the company had 400.0100 million shares outstanding. In 2025, CIQTEK reported revenue of RMB 666.191845 million. The company is based in Hefei, Anhui Province.   From Research to Real-World Use CIQTEK focuses on turning research capabilities into instruments that can be used in laboratories and industrial settings. At the ceremony, Dr. He Yu, Chairman of CIQTEK, said the listing is an important milestone and a stage in the company’s journey from the laboratory to real-world use. Dr. He thanked customers, partners, investors, and the teams that supported the offering and listing process. A Focus on Useful, Reliable Instruments CIQTEK develops high-end scientific instruments across several product areas. The company continues to invest in research and development and to expand its product portfolio around customer needs. Dr. He said that customer feedback, technical problem-solving, and reliable delivery are central to the company’s long-term improvement. CIQTEK will continue to advance projects funded by the offering and strengthen transparent, standardized governance. Looking Ahead Dr. He noted that better measurement tools support scientific discovery and that high-quality data remains essential as artificial intelligence changes the way research is done. CIQTEK will continue to build instruments for researchers and industrial users around the world. “We will stay focused, keep improving over the long term, and move forward steadily,” Dr. He said in closing.   Reprint Note The opening and “Listing Information” sections are reprinted from a Shanghai Stock Exchange public release. The remaining sections are adapted from an original address by Dr. He Yu, Chairman of CIQTEK, delivered at the listing ceremony.

Il microscopio elettronico a scansione a fascio ionico focalizzato a doppio fascio CIQTEK DB550 combina l'imaging elettronico ad alta risoluzione e l'elaborazione di precisione tramite fascio ionico in un'unica piattaforma. CIQTEK ha convalidato il suo Microscopio elettronico a scansione con fascio ionico focalizzato DB550 (FIB-SEM) su campioni reali di chip con nodo di processo a 5 nm, Dimostrazione di una preparazione di campioni TEM pronta per la produzione con strutture a pinna intatte, assenza di amorfizzazione e strati di film chiaramente risolti. I risultati confermano che il DB550 soddisfa le rigorose esigenze dei laboratori di analisi dei guasti dei semiconduttori avanzati che operano all'avanguardia della tecnologia di processo. Nella ricerca e produzione di chip avanzati, due strumenti rivestono un'importanza fondamentale. Il microscopio elettronico a trasmissione (TEM) permette di osservare le strutture a livello atomico. Ma prima di poterlo fare, è necessario un campione sufficientemente sottile da consentire il passaggio degli elettroni. Ed è qui che entra in gioco il microscopio elettronico a scansione a fascio ionico focalizzato (FIB-SEM) a doppio fascio. Si tratta di un laboratorio di precisione che prepara questi campioni ultrasottili. Vi presentiamo DB550: una piattaforma unica per l'imaging e l'elaborazione su scala nanometrica. IL CIQTEK DB550 FIB-SEM Integra due potenti funzionalità su un'unica piattaforma. Da un lato, un microscopio elettronico a scansione (SEM) fornisce immagini di superficie ad alta risoluzione. Dall'altro, un fascio ionico focalizzato (FIB) esegue la rimozione di materiale su scala nanometrica con precisione chirurgica. Insieme, colmano il divario tra osservazione e fabbricazione a dimensioni misurate in miliardesimi di metro. Nel cuore della DB550 si trova un colonna elettronica a bassa tensione e alta risoluzione abbinato alla tecnologia proprietaria di CIQTEK Colonna ionica "Chengying" Sviluppata interamente internamente, la colonna Chengying è il cuore pulsante del sistema, capace di effettuare tagli e incisioni su scala nanometrica. CIQTEK controlla l'intero processo di progettazione e produzione di questo componente fondamentale. La sfida dei 5 nm: perché la preparazione dei campioni diventa più difficile a ogni nodo tecnologico. A 5 nm e inferiori Le architetture dei chip si basano su transistor a effetto di campo di tipo aletta (FinFET) con larghezze e passi delle alette misurati in pochi nanometri. Il DB550 è progettato per gestire l'intero flusso di lavoro di preparazione del campione per questi nodi di processo esigenti. Inizia con taglio grosso ad alta corrente per rimuovere rapidamente il materiale ingombrante e raggiungere la regione target. Quindi passa a lucidatura fine a bassa tensione assottigliare il campione fino alle dimensioni adatte alla microscopia elettronica a trasmissione (TEM) senza danneggiare le delicate strutture sottostanti. Validazione TEM: la prova è nell'immagine CIQTEK...

A Winning Team: SEM + FIB, the "Golden Combination" CIQTEK brings SEM and FIB together as a powerful team, providing critical support for PCB process optimization, reliability verification, and root cause determination of failures. SEM High-Resolution Imaging: The "Microscope" for Surface Details The SEM uses a high-resolution electron beam to capture crisp images of PCB surface morphology. It reveals solder pad plating, intermetallic compounds, micro-cracks, tin whiskers, and foreign particle contamination with exceptional clarity. Coupled with energy-dispersive X-ray spectroscopy (EDS), the SEM also performs elemental analysis on microscopic regions. This combination lets engineers identify the chemical signature of defects, making it straightforward to spot issues like short circuits, open circuits, corrosion, and plating anomalies. FIB Nanoscale Cutting: The "Scalpel" for Internal Structures While the SEM excels at surface imaging, the FIB takes over when you need to see what is happening inside the board. Using a nanometer-precision ion beam, the FIB performs targeted cross-sectioning at the exact defect location. It prepares ultra-thin slices through multi-layer boards, blind vias, and buried vias, exposing internal structures that mechanical sectioning simply cannot reach. Think of the FIB as a microscopic surgical tool. It removes material with nanometer accuracy, leaving a clean cross-section ready for imaging and analysis. CIQTEK Semiconductor Showcase: See It in Action The Beauty of the Microscopic World, Revealed in Every Detail. Here are real examples of CIQTEK electron microscopes in PCB cross-section observation: Solder Joint Interface Panorama Low magnification observation of capacitor overall morphology, viewing the real microscopic structure of the capacitor solder joint interface from the inside IMC Layer Evaluation Evaluating interlayer bonding, measuring IMC thickness and uniformity, detecting voids, cracks, and interface defects Multi-Layer Board Inner Structure Clear observation of IMC layer morphology, thickness, continuity, and density at the solder pad and solder interface Process Reliability Evaluation Evaluating trace pattern, thickness, etching quality and copper-to-substrate bonding, detecting line shift, etch defects, delamination, voids, and analyzing plating layer quality for PCB process control and reliability assessment Built for Labs That Demand Reliability CIQTEK develops its electron microscopy platforms from the ground up, covering core algorithms through hardware design. This vertical integration ensures consistent performance and long-term supply stability, which matters for labs running continuous production or multi-year research programs. The company backs its instruments with responsive technical support and regular software updates, helping users keep their systems running efficiently over time. Get in Touch If you are evaluating SEM or FIB systems for your PCB inspection workflow, the CIQTEK team can...